ATOMIC BACKGROUND IN X-RAY-ABSORPTION SPECTRA OF 5TH-PERIOD ELEMENTS - EVIDENCE FOR DOUBLE-ELECTRON EXCITATION EDGES

被引:68
作者
FILIPPONI, A [1 ]
DICICCO, A [1 ]
机构
[1] UNIV CAMERINO, DIPARTIMENTO MATEMAT & FIS, I-62032 CAMERINO, ITALY
来源
PHYSICAL REVIEW A | 1995年 / 52卷 / 02期
关键词
D O I
10.1103/PhysRevA.52.1072
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A systematic x-ray absorption study to detect atomic background features at the K edges of fifth-period elements is reported. Samples of MoCx (Z = 42) and pure Rh (Z = 45), Pd (Z = 46), Ag (Z = 47), In (Z = 49), and Sn (Z = 50) are measured at high temperature, mostly in the liquid phase, to reduce the intensity of the structural extended x-ray absorption fine structure (EXAFS) contribution. Main anomalies, showing a regular trend as a function of Z, are identified in the region around 100 eV and in the range 200-800 eV above an edge. They are assigned to the opening of absorption channels creating double-hole configurations such as [1s4p], [1s, 3d], and [1s3p]. Differences of self-consistent calculations in the Dirac-Fock approximation have been performed and the dominant transitions unambiguously identified. The results are relevant for the improvement of the EXAFS analysis at these edges.
引用
收藏
页码:1072 / 1078
页数:7
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