USE OF A SCANNING TUNNELING MICROSCOPE TO RECTIFY OPTICAL FREQUENCIES AND MEASURE AN OPERATIONAL TUNNELING TIME

被引：41

作者：

LUCAS, AA

CUTLER, PH

FEUCHTWANG, TE

TSONG, TT

SULLIVAN, TE

YUK, Y

NGUYEN, H

SILVERMAN, PJ

机构：

[1] PENN STATE UNIV,UNIVERSITY PK,PA 16802

[2] AT&T BELL LABS,MURRAY HILL,NJ 07974

[3] IBM RES,ALMADEN RES CTR,SAN JOSE,CA 95120

[4] RCA LABS,CTR SOLID STATE TECHNOL,SOMMERVILLE,NJ 08540

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575396

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：461 / 465

页数：5

共 35 条

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