LINE-BROADENING ANALYSIS OF SYNCHROTRON X-RAY-DIFFRACTION DATA

[1] DETERMINATION OF TWIN FAULT PROBABILITIES FROM DIFFRACTION PATTERNS OF FCC METALS AND ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (06) : 2073 - &

[2] SYNCHROTRON X-RAY-POWDER DIFFRACTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (APR) : 85 - 95

[3] HUANG TC, 1984, ADV XRAY ANAL, V27, P45

[4] SYNCHROTRON X-RAY POLYCRYSTALLINE DIFFRACTOMETRY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 92 - 100

[5] PARRISH W, 1986, ADV XRAY ANAL, V29, P243

[6] PARRISH W, 1985, T AM CRYSTALLOGR ASS, V21, P51

[7] X-RAY MEASUREMENTS OF FAULTING IN AG-PD ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (10) : 4563 - &

[8] ROTHMAN RL, 1969, ADVAN XRAY ANAL, V12, P208

[9] A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 61 (346): : 382 - 391

[10] WAGNER CNJ, 1966, 15 OFF NAV RES TECHN

[1] DETERMINATION OF TWIN FAULT PROBABILITIES FROM DIFFRACTION PATTERNS OF FCC METALS AND ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (06) : 2073 - &

[2] SYNCHROTRON X-RAY-POWDER DIFFRACTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (APR) : 85 - 95

[3] HUANG TC, 1984, ADV XRAY ANAL, V27, P45

[4] SYNCHROTRON X-RAY POLYCRYSTALLINE DIFFRACTOMETRY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 92 - 100

[5] PARRISH W, 1986, ADV XRAY ANAL, V29, P243

[6] PARRISH W, 1985, T AM CRYSTALLOGR ASS, V21, P51

[7] X-RAY MEASUREMENTS OF FAULTING IN AG-PD ALLOYS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (10) : 4563 - &

[8] ROTHMAN RL, 1969, ADVAN XRAY ANAL, V12, P208

[9] A NUMERICAL FOURIER-ANALYSIS METHOD FOR THE CORRECTION OF WIDTHS AND SHAPES OF LINES ON X-RAY POWDER PHOTOGRAPHS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1948, 61 (346): : 382 - 391

[10] WAGNER CNJ, 1966, 15 OFF NAV RES TECHN