ADVANCES IN CHARGE NEUTRALIZATION FOR XPS MEASUREMENTS OF NONCONDUCTING MATERIALS

被引：160

作者：

BARTH, G

LINDER, R

BRYSON, C

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1988年 / 11卷 / 6-7期

关键词：

D O I：

10.1002/sia.740110607

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

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页码：307 / 311

页数：5

相关论文

共 8 条

[1] BARR TL, 1983, PRACTICAL SURFACE AN, P303
[2] BRYSON CE, Patent No. 4680467
[3] X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF HEXAFLUORODIANHYDRIDE-OXYDIANILINE POLYIMIDE - SUBSTANTIATION FOR SUBSTITUENT EFFECTS ON AROMATIC CARBON 1S BINDING-ENERGIES
BUCHWALTER, LP
SILVERMAN, BD
WITT, L
ROSSI, AR
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (02): : 226 - 230
[4] ESCA APPLIED TO POLYMERS .27. PLASMA POLYMERIZATION .2. ESCA INVESTIGATION OF POLYMERS SYNTHESIZED BY EXCITATION OF INDUCTIVELY COUPLED RF PLASMA IN PERFLUOROBENZENE AND PERFLUOROCYCLOHEXANE
CLARK, DT
SHUTTLEWORTH, D
[J]. JOURNAL OF POLYMER SCIENCE PART A-POLYMER CHEMISTRY, 1980, 18 (01) : 27 - 46
[5] BIASED REFERENCING EXPERIMENTS FOR THE XPS ANALYSIS OF NONCONDUCTING MATERIALS
EDGELL, MJ
BAER, DR
CASTLE, JE
[J]. APPLIED SURFACE SCIENCE, 1986, 26 (02) : 129 - 149
[6] KITTEL C, 1956, INTRO SOLID STATE PH, P266
[7] BINDING-ENERGY REFERENCE IN X-RAY PHOTOELECTRON-SPECTROSCOPY OF INSULATORS
LEWIS, RT
KELLY, MA
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 20 (1-2) : 105 - 115
[8] SMITH LP, 1958, HDB PHYSICS