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INCREASING THE SCANNING SPEED OF SCANNING TUNNELLING MICROSCOPES
被引:13
作者
:
ROBINSON, RS
论文数:
0
引用数:
0
h-index:
0
ROBINSON, RS
机构
:
来源
:
JOURNAL OF MICROSCOPY-OXFORD
|
1988年
/ 152卷
关键词
:
D O I
:
10.1111/j.1365-2818.1988.tb01400.x
中图分类号
:
TH742 [显微镜];
学科分类号
:
摘要
:
引用
收藏
页码:387 / 397
页数:11
相关论文
共 9 条
[1]
SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
SMITH, DPE
论文数:
0
引用数:
0
h-index:
0
SMITH, DPE
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1986,
57
(08)
: 1688
-
1689
[2]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1983,
126
(1-3)
: 236
-
244
[3]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[4]
TUNNELING MICROSCOPE FOR OPERATION IN AIR OR FLUIDS
DRAKE, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
DRAKE, B
SONNENFELD, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
SONNENFELD, R
SCHNEIR, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
SCHNEIR, J
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
HANSMA, PK
SLOUGH, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
SLOUGH, G
COLEMAN, RV
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
COLEMAN, RV
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1986,
57
(03)
: 441
-
445
[5]
SCANNING TUNNELING MICROSCOPY OF PROCESSES AT LIQUID SOLID INTERFACES
DRAKE, B
论文数:
0
引用数:
0
h-index:
0
DRAKE, B
SONNENFELD, R
论文数:
0
引用数:
0
h-index:
0
SONNENFELD, R
SCHNEIR, J
论文数:
0
引用数:
0
h-index:
0
SCHNEIR, J
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
HANSMA, PK
[J].
SURFACE SCIENCE,
1987,
181
(1-2)
: 92
-
97
[6]
SCANNING TUNNELING MICROSCOPY
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HANSMA, PK
TERSOFF, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TERSOFF, J
[J].
JOURNAL OF APPLIED PHYSICS,
1987,
61
(02)
: R1
-
R23
[7]
REFLECTION ELECTRON-MICROSCOPY (REM) OF FCC METALS
HSU, T
论文数:
0
引用数:
0
h-index:
0
HSU, T
COWLEY, JM
论文数:
0
引用数:
0
h-index:
0
COWLEY, JM
[J].
ULTRAMICROSCOPY,
1983,
11
(04)
: 239
-
250
[8]
LEACH WM, 1988, J AUDIO ENG SOC, V28, P410
[9]
SMALL RH, 1971, J AUDIO ENG SOC, V19, P12
←
1
→
共 9 条
[1]
SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
SMITH, DPE
论文数:
0
引用数:
0
h-index:
0
SMITH, DPE
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1986,
57
(08)
: 1688
-
1689
[2]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1983,
126
(1-3)
: 236
-
244
[3]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[4]
TUNNELING MICROSCOPE FOR OPERATION IN AIR OR FLUIDS
DRAKE, B
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
DRAKE, B
SONNENFELD, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
SONNENFELD, R
SCHNEIR, J
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
SCHNEIR, J
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
HANSMA, PK
SLOUGH, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
SLOUGH, G
COLEMAN, RV
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901
COLEMAN, RV
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1986,
57
(03)
: 441
-
445
[5]
SCANNING TUNNELING MICROSCOPY OF PROCESSES AT LIQUID SOLID INTERFACES
DRAKE, B
论文数:
0
引用数:
0
h-index:
0
DRAKE, B
SONNENFELD, R
论文数:
0
引用数:
0
h-index:
0
SONNENFELD, R
SCHNEIR, J
论文数:
0
引用数:
0
h-index:
0
SCHNEIR, J
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
HANSMA, PK
[J].
SURFACE SCIENCE,
1987,
181
(1-2)
: 92
-
97
[6]
SCANNING TUNNELING MICROSCOPY
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HANSMA, PK
TERSOFF, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TERSOFF, J
[J].
JOURNAL OF APPLIED PHYSICS,
1987,
61
(02)
: R1
-
R23
[7]
REFLECTION ELECTRON-MICROSCOPY (REM) OF FCC METALS
HSU, T
论文数:
0
引用数:
0
h-index:
0
HSU, T
COWLEY, JM
论文数:
0
引用数:
0
h-index:
0
COWLEY, JM
[J].
ULTRAMICROSCOPY,
1983,
11
(04)
: 239
-
250
[8]
LEACH WM, 1988, J AUDIO ENG SOC, V28, P410
[9]
SMALL RH, 1971, J AUDIO ENG SOC, V19, P12
←
1
→