SURFACE, INTERFACE AND THIN-FILM MAGNETISM - AN OVERVIEW

被引：11

作者：

FALICOV, LM ^{[1
]}

机构：

[1] LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720

来源：

THIN SOLID FILMS | 1992年 / 216卷 / 01期

关键词：

D O I：

10.1016/0040-6090(92)90889-J

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A general view is presented of the state of the art in the field of surface, interface and thin film magnetism. The following items are discussed: (1) new growth techniques which produce atomically engineered novel materials; (2) characterization techniques to measure magnetic properties of these systems; and (3) computational advances which allow large complex calculations. Issues of fundamental and technological interest for possible future research are highlighted.

引用

页码：169 / 173

页数：5