EFFECT OF FLUX CLOSURE AT EDGES OF THIN COBALT FILMS ON ELECTRON MICROSCOPE IMAGES

被引：8

作者：

JAKUBOVICS, JP

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1964年 / 10卷 / 106期

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D O I：

10.1080/14786436408228487

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：675 / &

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