MASK DEPENDENT ETCH RATES .3. THE EFFECT OF A SILVER ETCH MASK ON THE PLASMA ETCH RATE OF SILICON

被引:13
作者
FEDYNYSHYN, TH
GRYNKEWICH, GW
DUMAS, RH
机构
[1] Olin Research Cent, Cheshire, CT,, USA, Olin Research Cent, Cheshire, CT, USA
关键词
D O I
10.1149/1.2095578
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
2
引用
收藏
页码:268 / 269
页数:2
相关论文
共 2 条
[1]   THE EFFECT OF ALUMINUM VS PHOTORESIST MASKING ON THE ETCHING RATES OF SILICON AND SILICON DIOXIDE IN CF4/O2 PLASMAS [J].
FEDYNYSHYN, TH ;
GRYNKEWICH, GW ;
HOOK, TB ;
LIU, MD ;
MA, TP .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (01) :206-209
[2]  
FEDYNYSHYN TH, IN PRESS J ELECTROCH