COMPARISON BETWEEN XAFS EXPERIMENTS AND MULTIPLE-SCATTERING CALCULATIONS IN SILICON AND ZINCBLENDE

被引：35

作者：

SAINCTAVIT, P

PETIAU, J

BENFATTO, M

NATOLI, CR

机构：

[1] UNIV PARIS 07, F-75252 PARIS 05, FRANCE

[2] ST GOBAIN RECH, F-93304 AUBERVILLIERS, FRANCE

[3] IST NAZL FIS NUCL, NAZL FRASCATI LAB, I-00044 FRASCATI, ITALY

来源：

PHYSICA B-CONDENSED MATTER | 1989年 / 158卷 / 1-3期

关键词：

D O I：

10.1016/0921-4526(89)90308-6

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：347 / 350

页数：4

共 10 条

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[7] K X-RAY ABSORPTION-SPECTRA AND ELECTRONIC-STRUCTURE OF CHALCOPYRITE CUFES2
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[8] XANES STUDY OF SULFUR AND ZINC K-EDGES IN ZINCBLENDE - EXPERIMENTS AND MULTIPLE-SCATTERING CALCULATIONS
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[J]. JOURNAL DE PHYSIQUE, 1987, 48 (C-9): : 1109 - 1112
[9] SLATER JC, 1979, SELF CONSISTENT FIEL
[10] X-RAY ABSORPTION IN IONIC MATERIALS
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[J]. JOURNAL DE PHYSIQUE, 1986, 47 (C-8): : 43 - 47

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