MAGNETORESISTANCE AND KERR EFFECT INVESTIGATIONS OF CO/CU MULTILAYERS WITH WEDGE-SHAPED CU LAYERS

被引：15

作者：

MATTHEIS, R

ANDRA, W

FRITZSCH, L

HUBERT, A

RUHRIG, M

THRUM, F

机构：

[1] UNIV ERLANGEN NURNBERG,INST WW6,W-852 ERLANGEN,GERMANY

[2] FRIEDRICH SCHILLER UNIV,INST ANGEW PHYS,O-6900 JENA,GERMANY

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1993年 / 121卷 / 1-3期

关键词：

D O I：

10.1016/0304-8853(93)91237-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The magnetic coupling behaviour of dc-magnetron sputtered Co/Cu multilayers with wedge shaped Cu interlayers was investigated by magnetoresistance (MR). The well known oscillatory behaviour of both the amplitude of the MR effect and the saturation field H(s) was found. Within the first region of antiferromagnetic coupling around 1 nm Cu there is a different thickness dependence of H(s) and MR presumably caused due to the imperfect structure of our multilayer System. Domain nucleation and reversal behaviour were studied by Kerr microscopy and correlated with the observed coupling states determined by MR. There were no clear hints for a biquadratic coupling term.

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页码：424 / 428

页数：5

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