A SIMPLE FORMULA FOR THE ESTIMATION OF THE CAPACITANCE OF TWO-DIMENSIONAL INTERCONNECTS IN VLSI CIRCUITS

被引：78

作者：

YUAN, CP

TRICK, TN

机构：

来源：

ELECTRON DEVICE LETTERS | 1982年 / 3卷 / 12期

关键词：

D O I：

10.1109/EDL.1982.25610

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：391 / 393

页数：3

共 7 条

[1] ANALYTICAL IC METAL-LINE CAPACITANCE FORMULAS
CHANG, WH
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (09) : 608 - 611
[2] CHANG WH, 1977, IEEE T MICROWAVE AUG, P712
[3] DANG RLM, 1981, ELECTRON DEVIC LETT, V2, P196
[4] CAPACITANCE CALCULATIONS IN MOSFET VLSI
ELMASRY, MI
[J]. ELECTRON DEVICE LETTERS, 1982, 3 (01): : 6 - 7
[5] Palmer H. B., 1937, ELECT ENG, V56, P363, DOI DOI 10.1109/EE.1937.6540485
[6] SMYTHE WR, 1950, STATIC DYNAMIC ELECT, P78
[7] CALCULATION OF COEFFICIENTS OF CAPACITANCE OF MULTICONDUCTOR TRANSMISSION LINES IN PRESENCE OF DIELECTRIC INTERFACE
WEEKS, WT
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (01) : 35 - +