RATIO TECHNIQUE FOR MICRO-AUGER ANALYSIS

被引：63

作者：

JANSSEN, AP ^{[1
]}

HARLAND, CJ ^{[1
]}

VENABLES, JA ^{[1
]}

机构：

[1] UNIV SUSSEX,SCH MATH & PHYS SCI,BRIGHTON BN1 9QH,SUSSEX,ENGLAND

来源：

关键词：

D O I：

10.1016/0039-6028(77)90443-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：277 / 292

页数：16

共 19 条

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RIVIERE, JC
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &
[2] BISHOP HE, 1974, AERE7899 REP
[3] BISHOP HE, 1976, AERE8369 REP
[4] ESTIMATION OF BACKSCATTERING EFFECTS IN ELECTRON-INDUCED AUGER SPECTRA
GALLON, TE
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (04) : 822 - &
[5] GRESSUS CL, 1975, COMPT REND PARIS B, V280, P439
[6] KIRSCHNER J, 1976, IITRISEM215
[7] MARCUS HL, 1969, T METALL SOC AIME, V245, P1664
[8] MCDONALD NC, 1971, IITRISEM89
[9] MCDONALD NC, 1971, APPL PHYS LETT, V19, P315
[10] MCDONALD NC, 1970, IITRISEM27