GROWTH DIRECTION CONTROL IN YBCO THIN-FILMS

被引:61
作者
VASSENDEN, F [1 ]
LINKER, G [1 ]
GEERK, J [1 ]
机构
[1] KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH,INST NUKL FESTKORPERPHYS,W-7500 KARLSRUHE 1,GERMANY
来源
PHYSICA C | 1991年 / 175卷 / 5-6期
关键词
D O I
10.1016/0921-4534(91)90265-Z
中图分类号
O59 [应用物理学];
学科分类号
摘要
The crystallographic orientation of thin films of Y1Ba2Cu3O7 (YBCO) on MgO and SrTiO3 was investigated with theta-2-theta X-ray diffraction. The fraction of a-axis oriented material was measured as a function of substrate temperature during growth. Films prepared at substrate table temperatures yielding maximum T(c) were purely c-axis oriented up to a critical film thickness (less-than-or-equal-to 5500 angstrom), above which also a-axis material was observed. Our hypothesis was that the substrate temperature is lowered during deposition due to the increasing emissivity of the film as it reaches a thickness comparable with the IR penetration depth, and that this lowered substrate temperature makes a-axis growth possible. We estimated this cooling effect, and found that it was too small to allow for a-axis oriented growth. The cooling hypothesis is contrasted to a-axis oriented growth caused by an increased density of lattice imperfections with growing film thickness.
引用
收藏
页码:566 / 572
页数:7
相关论文
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