A CUSTOM INTEGRATED-CIRCUIT COMPARATOR FOR HIGH-PERFORMANCE SAMPLING APPLICATIONS

被引:23
作者
LAUG, OB
SOUDERS, TM
FLACH, DR
机构
[1] National Institute of Standards and Technology, Gaithersburg
关键词
D O I
10.1109/19.199421
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports on the design and performance of an application-specific integrated circuit (ASIC) comparator that has been optimized for equivalent-time waveform sampling applications. The comparator, which has been fabricated with an 8.5 GHz f(T), bipolar silicon process, features a band-width of > 2 GHz, a settling-time accuracy of 0.1 % in 2 ns, and almost total elimination of ''thermal tails'' in the settling response. Several novel design features that have been used to achieve this level of performance are presented. The comparator can be used in a sampling system for both frequency-domain measurements, e.g., wideband rms voltage measurements, and high-accuracy time-domain pulse measurements.
引用
收藏
页码:850 / 855
页数:6
相关论文
共 11 条
[1]  
ANDREWS JR, 1983, IEEE T INSTRUM MEAS, V32, P327
[2]  
GYLES C, 1989, IEEE T INSTRUM MEAS, V38
[3]  
HALBERT J, 1983, 1983 P INT TEST C PH
[4]  
HUANG DX, 1991, IEEE T INSTRUM MEAS, V40, P360
[5]   DETERMINATION OF AC-DC DIFFERENCE IN THE 0.1-100 MHZ FREQUENCY-RANGE [J].
KINARD, JR ;
CAI, TX .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :360-367
[6]   AN ULTRAHIGH-SPEED GAAS-MESFET OPERATIONAL-AMPLIFIER [J].
LARSON, LE ;
CHOU, CS ;
DELANEY, MJ .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (06) :1523-1528
[7]   AN 8-BIT 200-MHZ BICMOS COMPARATOR [J].
LIM, PJ ;
WOOLEY, BA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (01) :192-199
[8]   AN 8-BIT 250 MEGASAMPLE PER 2ND ANALOG-TO-DIGITAL CONVERTER - OPERATION WITHOUT A SAMPLE AND HOLD [J].
PEETZ, B ;
HAMILTON, BD ;
KANG, J .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1986, 21 (06) :997-1002
[9]  
Souders T.M., 1987, IEEE T INSTRUM MEAS, VIM-36
[10]   ACCURATE RF VOLTAGE MEASUREMENTS USING A SAMPLING VOLTAGE TRACKER [J].
SOUDERS, TM ;
HETRICK, PS .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :451-456