TRANSITION NOISE PROPERTIES IN LONGITUDINAL THIN-FILM MEDIA

Transition noise properties in longitudinal thin film media is studied by micromagnetic modeling. Mechanism for enhancement of transition noise at small bit intervals due to inter-transition interaction is investigated. Noise dependence on the medium parameters, such as saturation magnetization and film thickness, is calculated. Reducing either the saturation magnetization or the film thickness yields a reduction of transition noise at low recording densities and a reduction of the noise enhancement at high recording densities. Effect of stress induced longitudinal magnetic orientation is studied for an application of a uniaxial and spatial uniform compressive stress in the recording direction. The calculation shows that films with higher orientation ratio exhibit higher transition noise at small bit intervals.