INFLUENCE OF STOICHIOMETRY ON STRUCTURE OF VACUUM-DEPOSITED CDSE FILMS

被引：7

作者：

DAWERITZ, L ^{[1
]}

DORNICS, M ^{[1
]}

机构：

[1] UNIV BERLIN,SEK PHYS,BERLIN,GERMANY

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1973年 / 20卷 / 01期

关键词：

D O I：

10.1002/pssa.2210200153

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K37 / K39

页数：3

共 9 条

BERGER, H .

PHYSICA STATUS SOLIDI, 1961, 1 (07) :739-757

[2] VARIATIONS IN RESISTIVITY OF EVAPORATED FILMS OF CADMIUM-SULFIDE [J].

BUCKLEY, RW ;

WOODS, J .

[3]

DAWERITZ L, 1971, THESIS HUMBOLDT U

[4]

Shalimov K. V., 1964, KRISTALLOGRAFIYA, V9, P741

[5]

Shalimova K. V., 1970, Kristallografiya, V15, P342

[6]

SHALIMOVA KV, 1964, KRISTALLOGRAFIYA, V9, P559

[7]

SHALIMOVA KV, 1965, KRISTALLOGRAFIYA, V10, P497

[8] CRYSTALLINE STRUCTURE OF ZNTE THIN FILMS [J].

SPINULES.I .

PHYSICA STATUS SOLIDI, 1966, 18 (02) :769-&

[9] GROWTH OF HEXAGONAL CRYSTALLITES IN CDTE THIN FILMS [J].

SPINULES.I .

PHYSICA STATUS SOLIDI, 1966, 15 (02) :761-&