PREPARATION OF ZRO2 ON FLAT, CONDUCTING SIO2/SI(100) MODEL SUPPORTS BY WET CHEMICAL TECHNIQUES - X-RAY PHOTOELECTRON-SPECTROSCOPY AND AUGER DEPTH PROFILING

Model supports consisting of a thin layer of SiO2 on a silicon single crystal have been used to study ZrO2/SiO2/Si model catalysts made by wet chemical preparation methods. Auger depth profiling and angle-dependent X-ray photoelectron spectroscopy show that catalysts prepared by a surface reaction between zirconium ethoxide and hydroxyl groups on the SiO2 contain a highly dispersed zirconium phase that is converted to ZrO2 upon calcination.