CONTRAST FROM TWIN BOUNDARIES IN FIELD-ION MICROGRAPHS

Computer simulation and geometrical construction have been used to study the contrast from twin boundaries in field-ion micrographs. For specific orientations of the twin boundary, m rings of (hkl) planes in the matrix are expected to match with n rings of (h′k′l′) planes in the twin, where m and n are integers and (hkl) and (h′k′l′) are prominent planes in the matrix and the twin, respectively. © 1969 The American Institute of Physics.