QUANTITATIVE ELECTRON-DIFFRACTION FROM THIN-FILMS

[1] STEP STRUCTURE AND DIMER ROW CORRELATIONS IN VICINAL SI(100) [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 1963 - 1965

[2] DIFFRACTION DETERMINATION OF THE STRUCTURE OF METASTABLE 3-DIMENSIONAL CRYSTALS OF GE GROWN ON SI(001) [J]. APPLIED PHYSICS LETTERS, 1991, 59 (09) : 1061 - 1063

[3] SURFACE CHARACTERIZATION BY RHEED TECHNIQUES DURING MBE GROWTH OF GAAS AND ALXGA1-XAS [J]. SUPERLATTICES AND MICROSTRUCTURES, 1991, 9 (02) : 141 - 145

[4] HECHT E, 1987, OPTICS, pCH10

[5] HENZLER M, 1977, ELECTRON SPECTROSCOP

[6] JOYCE BA, 1989, REFLECTION HIGH ENER

[7] LAGALLY MG, 1992, ENCY MATERIALS CHARA

[8] LAGALLY MG, 1989, REFLECTION HIGH ENER

[9] LAGALLY MG, 1985, METHODS EXPT PHYSICS, V223, pCH5

[10] LAGALLY MG, 1986, METALS HDB, V10

[1] STEP STRUCTURE AND DIMER ROW CORRELATIONS IN VICINAL SI(100) [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 1963 - 1965

[2] DIFFRACTION DETERMINATION OF THE STRUCTURE OF METASTABLE 3-DIMENSIONAL CRYSTALS OF GE GROWN ON SI(001) [J]. APPLIED PHYSICS LETTERS, 1991, 59 (09) : 1061 - 1063

[3] SURFACE CHARACTERIZATION BY RHEED TECHNIQUES DURING MBE GROWTH OF GAAS AND ALXGA1-XAS [J]. SUPERLATTICES AND MICROSTRUCTURES, 1991, 9 (02) : 141 - 145

[4] HECHT E, 1987, OPTICS, pCH10

[5] HENZLER M, 1977, ELECTRON SPECTROSCOP

[6] JOYCE BA, 1989, REFLECTION HIGH ENER

[7] LAGALLY MG, 1992, ENCY MATERIALS CHARA

[8] LAGALLY MG, 1989, REFLECTION HIGH ENER

[9] LAGALLY MG, 1985, METHODS EXPT PHYSICS, V223, pCH5

[10] LAGALLY MG, 1986, METALS HDB, V10