A NEW METHOD FOR THE DETERMINATION OF GOODNESS-OF-FIT IN GAMMA-SPECTROSCOPY

被引：9

作者：

AARNIO, PA

KOSKELO, MJ

ZOMBORI, P

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1981年 / 184卷 / 2-3期

关键词：

D O I：

10.1016/0029-554X(81)90751-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：487 / 492

页数：6

共 7 条

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BALIAN, HG
EDDY, NW
[J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 145 (02): : 389 - 395
[2] GUNNINK R, 1972, UCRL51061 LAWR LIV L, V1
[3] KOSKELO MJ, 1979, 1979 M ANS ATL
[4] IFOM, A FORMULA FOR UNIVERSAL ASSESSMENT OF GOODNESS-OF-FIT OF GAMMA-RAY SPECTRA
MISRA, SK
EDDY, NW
[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 166 (03): : 537 - 540
[5] PARR RM, 1979, 1978 P ANS TOP C COM, P544
[6] PEAK SEARCH AND ANALYSIS OF GAMMA-RAY SPECTRA WITH VERY LOW STATISTICS
PHILLIPS, GW
MARLOW, KW
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (01) : 154 - 157
[7] PHOTOPEAK METHOD FOR COMPUTER ANALYSIS OF GAMMA-RAY SPECTRA FROM SEMICONDUCTOR DETECTORS
ROUTTI, JT
PRUSSIN, SG
[J]. NUCLEAR INSTRUMENTS & METHODS, 1969, 72 (02): : 125 - &