A MICROWAVE DIELECTRIC MEASUREMENT TECHNIQUE FOR HIGH PERMITIVITY MATERIALS

被引:17
作者
LANAGAN, MT
KIM, JH
DUBE, DC
JANG, SJ
NEWNHAM, RE
机构
关键词
D O I
10.1080/00150198808201341
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:91 / 97
页数:7
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