ANALYSIS OF ACCELERATED LIFE TEST DATA .2. NUMERICAL METHODS AND TEST PLANNING

被引：10

作者：

NELSON, W

机构：

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1972年 / EI 7卷 / 01期

关键词：

D O I：

10.1109/TEI.1972.299187

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：36 / &

共 15 条

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