FIRST-EXCURSION FAILURE OF RANDOMLY EXCITED STRUCTURES

被引：37

作者：

LIN, YK

机构：

来源：

关键词：

D O I：

10.2514/3.5747

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

引用

页码：720 / &

共 15 条

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