A NOTE ON THE THEORIES UNDERLYING THE POLARIMETRIC STUDY OF VERY THIN DIELECTRIC SURFACE LAYERS

被引:9
作者
NOMURA, S
KINOSITA, K
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10.1143/JPSJ.14.297
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O4 [物理学];
学科分类号
0702 ;
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页码:297 / 303
页数:7
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共 9 条
[1]  
ALKEMADE AC, 1883, WIED ANN, V20, P22
[2]  
DRUDE P, 1912, LEHRBUCH OPTIK
[3]  
KINOSITA K, 1953, J OPT SOC AM, V43, P924
[4]   An optical investigation of oxide films on metals [J].
Leberknight, CE ;
Lustman, B .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1939, 29 (02) :59-66
[5]  
Sissingh R, 1926, PHYS Z, V27, P518
[6]  
STRACHAN CS, 1933, P CAMBRIDGE PHIL SOC, V29, P116
[7]   A new method for investigating the refractive index and the thickness of thin interference films on glass [J].
Vasicek, A .
PHYSICAL REVIEW, 1940, 57 (10) :925-931
[8]   OPTICAL DETERMINATION OF THIN FILMS ON REFLECTING BASES IN TRANSPARENT ENVIRONMENTS [J].
WINTERBOTTOM, AB .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1948, 38 (12) :1074-1082
[9]   OPTICAL METHODS OF STUDYING FILMS ON REFLECTING BASES DEPENDING ON POLARISATION AND INTERFERENCE PHENOMENA [J].
WINTERBOTTOM, AB .
TRANSACTIONS OF THE FARADAY SOCIETY, 1946, 42 (6-7) :487-495