FREQUENCY MEASUREMENTS IN FAR INFRARED - LIMITATIONS IMPOSED BY NOISE SPECTRUM IN HARMONIC MIXING

被引：1

作者：

FRENKEL, L

SULLIVAN, T

机构：

[1] NASA Electronics Research Center, Cambridge

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1969年 / MT17卷 / 05期

关键词：

D O I：

10.1109/TMTT.1969.1126952

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Beat frequencies resulting from several orders of mixing of the power of two klystrons have been studied on a spectrum analyzer. The 5th-order beat note of klystrons operating at 130 and 65 GHz, respectively, has been counted directly. It is found that higher order beats are generally buried in the noise but that the frequency average can be accurately determined. © 1969 IEEE. All rights reserved

引用

页码：281 / &

共 4 条

[1] HYPERFINE STRUCTURE IN MILLIMETER SPECTRUM OF HYDROGEN SULFIDE - ELECTRIC RESONANCE SPECTROSCOPY ON ASYMMETRIC-TOP MOLECULES [J].