A STUDY OF CONTRAST BANDS IN BETA-SIC WHISKERS

Diffraction contrast bands normal to the growth direction in thin β-SiC whiskers are often observed. From selected area diffraction and dark-field electron microscopy it was determined that the bands are caused by microtwins, many of which are less than 50 Å in thickness. Non-parallelism of the bands occurs due to distortion of the lattice planes when the crystal is bent or twisted. Within the streaks resulting from the elongation of intensity regions in a direction normal to the thin lamellae subsidiary maxima can be resolved. © 1969.