NEW TECHNIQUE FOR INVESTIGATING NONCRYSTALLINE STRUCTURES - FOURIER ANALYSIS OF EXTENDED X-RAY - ABSORPTION FINE STRUCTURE

被引：1217

作者：

SAYERS, DE

STERN, EA

LYTLE, FW

机构：

来源：

关键词：

D O I：

10.1103/PhysRevLett.27.1204

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1204 / &

共 19 条

[1] THEORY OF EXTENDED FINE STRUCTURE OF X-RAY ABSORPTION EDGES
AZAROFF, LV
[J]. REVIEWS OF MODERN PHYSICS, 1963, 35 (04) : 1012 - &
[2] RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS
DOYLE, PA
TURNER, PS
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 : 390 - &
[3] Fine structure in X-ray absorption spectra
Hanawalt, JD
[J]. JOURNAL OF THE FRANKLIN INSTITUTE, 1932, 214 : 569 - 584
[4] HANAWALT JD, 1930, Z PHYS, V70, P293
[5] HEIDENREICH RD, 1964, FUNDAMENTALS TRANSMI, P45
[6] ATOMIC ARRANGEMENT IN VITREOUS SELENIUM
KAPLOW, R
ROWE, TA
AVERBACH, BL
[J]. PHYSICAL REVIEW, 1968, 168 (03): : 1068 - &
[7] LIGHT TB, 1969, PHYS REV LETT, V22, P1058
[8] Lytle F., 1966, ADV X-RAY ANAL, V9, P398
[9] LYTLE FW, 1963, DEV APPLIED SPECTROS, V2, P285
[10] MOSS SC, 1970, 10TH P INT C PHYS SE, P658