MEASUREMENTS OF PHYSICAL PROPERTIES OF THIN BI FILMS FROM 180 TO 40000 A

被引：11

作者：

SUBOTOWICZ, M ^{[1
]}

JALOCHOWSKI, M ^{[1
]}

MIKOLAJCZAK, B ^{[1
]}

MIKOLAJCZAK, P ^{[1
]}

机构：

[1] UNIV M CURIE SKLODOWSKA, INST PHYS, DEPT EXPTL PHYS, LUBLIN, POLAND

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1973年 / 17卷 / 01期

关键词：

D O I：

10.1002/pssa.2210170107

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：79 / 87

页数：9

共 18 条

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[3]

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[4] The conductivity of thin metallic films according to the electron theory of metals [J].

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[5] GALVANOMAGNETIC STUDIES OF BISMUTH FILMS IN QUANTUM-SIZE-EFFECT REGION [J].

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KAO, YH .

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[6]

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[7] ELECTRICAL TRANSPORT PROPERTIES OF THIN BISMUTH FILMS [J].

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FRANKL, DR .

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[8]

KAIDANOV G, 1958, ZH TEKH FIZ, V28, P403

[9]

KOMNIK JF, 1971, ZH EKSP TEOR FIZ, V60, P669

[10]

Lutskii V. N., 1970, Physica Status Solidi A, V1, P199, DOI 10.1002/pssa.19700010202

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