ACCURATE CONDUCTOR Q-FACTOR OF DIELECTRIC RESONATOR PLACED IN AN MIC ENVIRONMENT

被引：13

作者：

MONGIA, RK ^{[1
]}

BHARTIA, P ^{[1
]}

机构：

[1] DEF RES ESTAB OTTAWA,DIV RADAR,OTTAWA K1A 0Z4,ON,CANADA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1993年 / 41卷 / 03期

关键词：

D O I：

10.1109/22.223743

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

The unloaded Q-factor of a dielectric resonator is degraded due to conductor loss when it is placed in an MIC environment. In this paper, we report approximate but quite accurate closed form expressions for the Q-factor due to conductor loss. The results obtained are in good agreement with those of rigorous numerical methods. The effect of geometrical parameters on the useful tuning range of the structure is studied. Finally, an explicit relationship between the resonant frequency sensitivity factors and the conductor Q-factor is derived.

引用

页码：445 / 449

页数：5

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