SCALING BEHAVIOR IN ELECTRICAL TRANSPORT ACROSS GRAIN-BOUNDARIES IN YBA2CU3O7-DELTA SUPERCONDUCTORS

被引：119

作者：

GROSS, R

CHAUDHARI, P

KAWASAKI, M

GUPTA, A

机构：

[1] IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598

来源：

PHYSICAL REVIEW B | 1990年 / 42卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.42.10735

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have found that the product of the critical current and the resistance of a grain-boundary junction scale with the resistance of the boundary. This scaling is observed to hold for a variety of samples prepared by evaporation or laser ablation and whose critical current density varies by three orders of magnitude. © 1990 The American Physical Society.

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页码：10735 / 10737

页数：3

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