DIELECTRIC PROPERTY MEASUREMENT SYSTEM AT CRYOGENIC TEMPERATURES AND MICROWAVE-FREQUENCIES

被引：37

作者：

MOLLA, J ^{[1
]}

IBARRA, A ^{[1
]}

MARGINEDA, J ^{[1
]}

ZAMARRO, JM ^{[1
]}

HERNANDEZ, A ^{[1
]}

机构：

[1] UNIV MURCIA,DEPT FIS APLICADA,E-30071 MURCIA,SPAIN

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1993年 / 42卷 / 04期

关键词：

D O I：

10.1109/19.234491

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A system based on the resonant cavity method has been developed to measure the permittivity and loss tangent at 12-18 GHz over the temperature range 80 K-300 K. Changes of permittivity as low as 0.01% in the range 1-30, 3 X 10(-6) for loss tangent values below 10(-2), can be measured without requiring temperature stability. The thermal expansion coefficient and resistivity factor of copper have been measured between 80 K and 300 K. The permittivity of sapphire and loss tangent of alumina of 99.9% purity in the same temperature range are presented.

引用

页码：817 / 821

页数：5

共 23 条

[1]

Afsar M. N., 1990, 15 INT C INFR MILL W, V1514, P544

[2]

Ashcroft N W, 1976, SOLID STATE PHYS, P8

[3] EXPERIMENTAL-OBSERVATION OF FUNDAMENTAL MICROWAVE-ABSORPTION IN HIGH-QUALITY DIELECTRIC CRYSTALS [J].