VANDERWAALS INTERACTIONS IN FORCE MICROSCOPY

被引：5

作者：

HARTMANN, U ^{[1
]}

机构：

[1] FORSCHUNGSZENTRUM JULICH, INST THIN FILM & ION TECHNOL, W-5170 JULICH 1, GERMANY

来源：

ADVANCED MATERIALS | 1990年 / 2卷 / 12期

关键词：

D O I：

10.1002/adma.19900021208

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Due to its high sensitivity, scanning force microscopy offers the possibility to map minute van der Waals forces between microprobe and sample surface at high spatial resolution. A detailed theoretical analysis confirms that the interactions involved directly reflect near-surface dielectric properties hardly accessible to conventional detection techniques. This opens a new field of application to modern scanned-probe techniques: van der Waals microscopy.

引用

页码：594 / 597

页数：4

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