SURFACE CHARACTERIZATION VIA OPTICAL DIFFRACTION

被引:2
作者
MANSFIELD, D
机构
关键词
D O I
10.1016/0890-6955(92)90054-K
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Through the consideration of a surface as a reflective phase grating, this paper establishes the various relationships between the statistical parameters of the surface topology and the far-field diffraction pattern. These relationships have been incorporated into a new measuring instrument designed primarily for the measurement of flats and cylinders, the Talyfine. The performance of this instrument is compared against an established stylus-based surface texture measuring instrument, the Talystep.
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页码:11 / 17
页数:7
相关论文
共 3 条
[1]  
Goodman, Introduction to Fourier Optics, (1968)
[2]  
Davies, Proc. Inst. Elec. Engrs., 101, (1954)
[3]  
Bennett, Porteus, Relation Between Surface Roughness and Specular Reflectance at Normal Incidence, Journal of the Optical Society of America, 51, (1961)