ION-BEAM MIXING OF BIMETALLIC SYSTEMS - CEMS STUDIES

被引:5
作者
PRINCIPI, G
机构
[1] Dipartimento di Ingegneria Meccanica, Sezione Materiali, Padova, 35131
来源
HYPERFINE INTERACTIONS | 1991年 / 66卷 / 1-4期
关键词
D O I
10.1007/BF02395864
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
The effect of irradiation with argon, krypton and xenon energetic ions of bimetallic systems containing a Mossbauer active element is reviewed to show the contribution of conversion electron Mossbauer spectroscopy (CEMS) to the studies of the ion-beam mixing mechanisms and to the structural characterization of mixed interfaces. In the field of ion beam mixing, CEMS is often used to complement the more used RBS, TEM, XRD, XPS, SIMS, AES and SEM analytical techniques. Recent results concerning the Fe/Pd, Fe/Ni and Fe/Al couples mixed with argon and krypton ions are presented and discussed.
引用
收藏
页码:149 / 165
页数:17
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