A MICROSTRIP DEVICE FOR THE BROAD-BAND SIMULTANEOUS MEASUREMENT OF COMPLEX PERMEABILITY AND PERMITTIVITY

被引：64

作者：

QUEFFELEC, P ^{[1
]}

GELIN, P ^{[1
]}

GIERALTOWSKI, J ^{[1
]}

LOAEC, J ^{[1
]}

机构：

[1] ENST BRETAGNE,LEST,F-29285 BREST,FRANCE

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 02期

关键词：

D O I：

10.1109/20.312262

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The method presented here aims at determining the complex permeability mu* and permittivity of epsilon* with an automatic and broad band (45 MHz-18 GHz) system from the reflection-transmission measurement of the S-parameters of a microstrip test device. The complex values epsilon* and mu* are obtained with the S-parameters from a specific software created within the context of this work. Compared with previous methods, our measurement technique is fast, easy to implement and does not require any calibration test sample or pick-up coils. Lastly, an analysis of the error depending on the method used and the results found with bulk isotropic materials (dielectrics and ferrites) are presented.

引用

页码：224 / 231

页数：8

共 15 条

[1] A BROAD-BAND, AUTOMATED, STRIPLINE TECHNIQUE FOR THE SIMULTANEOUS MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY [J].