CHEMICAL LATTICE IMAGING OF A NI-BASED SUPERALLOY

被引：13

作者：

PENISSON, JM ^{[1
]}

BODE, M ^{[1
]}

BAUMANN, FH ^{[1
]}

OURMAZD, A ^{[1
]}

机构：

[1] AT&T BELL LABS,HOLMDEL,NJ 07733

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1991年 / 64卷 / 05期

关键词：

D O I：

10.1080/09500839108214621

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We demonstrate the application of quantitative chemical lattice imaging techniques to a metallic system. The first results establish that the chemical interface between-UPSILON and UPSILON'-phases of a nickel-based superalloy can be quantitatively identified.

引用

页码：269 / 276

页数：8

共 9 条

[1] BAUMANN FH, 1991, B AM PHYS SOC, V36, P474
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[7] DETERMINATION OF THE ATOMIC CONFIGURATION AT SEMICONDUCTOR INTERFACES
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[8] CHEMICAL MAPPING OF SEMICONDUCTOR INTERFACES AT NEAR-ATOMIC RESOLUTION
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[J]. PHYSICAL REVIEW LETTERS, 1989, 62 (08) : 933 - 936
[9] QUANTIFYING THE INFORMATION-CONTENT OF LATTICE IMAGES
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KIM, Y
[J]. SCIENCE, 1989, 246 (4937) : 1571 - 1577

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