POTENTIAL DEPENDENCE OF THE OPTICAL-PROPERTIES OF THE COPPER-VERTICAL-BAR-AQUEOUS BORAX INTERFACE

被引：25

作者：

CERE, S ^{[1
]}

DESANCHEZ, SR ^{[1
]}

SCHIFFRIN, DJ ^{[1
]}

机构：

[1] UNIV LIVERPOOL, DEPT CHEM, LIVERPOOL L69 3BX, MERSEYSIDE, ENGLAND

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1995年 / 386卷 / 1-2期

关键词：

ELLIPSOMETRY; REFLECTANCE SPECTROSCOPY; OXYGEN REDUCTION; CUPROUS OXIDE; COPPER ELECTROCHEMISTRY;

D O I：

10.1016/0022-0728(95)03828-5

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The potential dependence of the optical properties of a copper surface at potentials where CuO and Cu2O are reduced has been studied by in situ ellipsometry in 0.1 M borax. It is shown that a thin layer of a copper(I) oxide remains on the surface even after extensive reduction. It is proposed that these oxide films play an important role in the kinetics of oxygen and hydrogen peroxide reduction.

引用

页码：165 / 171

页数：7

共 30 条

[1]

Beccaria, Crousier, Br. Corros. J., 26, (1991)

[2]

North, Pryor, Corros. Sci., 10, (1970)

[3]

Mor, Beccaria, Corrosion, 30, (1974)

[4]

Giuliani, Bombara, An Electrochemical Study of Copper Alloys In Chloride Solutions, British Corrosion Journal, 5, (1970)

[5]

Bianchi, Fiori, Longhi, Mazza, Corrosion (NACE), 34, (1978)

[6]

Vazquez, de Sanchez, Calvo, Schiffrin, The electrochemical reduction of hydrogen peroxide on polycrystalline copper in borax buffer, Journal of Electroanalytical Chemistry, 374, (1994)

[7]

Vazquez, de Sanchez, Calvo, Schiffrin, The electrochemical reduction of oxygen on polycrystalline copper in borax buffer, Journal of Electroanalytical Chemistry, 374, (1994)

[8]

de Sanchez, Berlouis, Schiffrin, Difference reflectance spectroscopy of anodic films on copper and copper base alloys, Journal of Electroanalytical Chemistry and Interfacial Electrochemistry, 307, (1991)

[9]

Shanley, Hummel, Verink, Corros. Sci., 20, (1980)

[10]

Urban, Hummel, Verink, Corros. Sci., 22, (1982)

← 1 2 3 →