PHOTOREFLECTANCE STUDY OF NARROW-WELL STRAINED-LAYER INXGA1-XAS/GAAS COUPLED MULTIPLE-QUANTUM-WELL STRUCTURES

被引：202

作者：

PAN, SH

SHEN, H

HANG, Z

POLLAK, FH

ZHUANG, WH

XU, Q

ROTH, AP

MASUT, RA

LACELLE, C

MORRIS, D

机构：

[1] CUNY BROOKLYN COLL,DEPT PHYS,BROOKLYN,NY 11210

[2] CHINESE ACAD SCI,INST SEMICOND,BEIJING,PEOPLES R CHINA

[3] NATL RES COUNCIL CANADA,DIV PHYS,OTTAWA K1A 0R6,ONTARIO,CANADA

[4] CUNY GRAD SCH & UNIV CTR,NEW YORK,NY 10036

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.38.3375

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：3375 / 3382

页数：8

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