SCHERRER AFTER 60 YEARS - SURVEY AND SOME NEW RESULTS IN DETERMINATION OF CRYSTALLITE SIZE

[1] ABRAMOWITZ M, 1964, HDB MATHEMATICAL FUN

[2] Anantharaman T.R., 1966, P INDIAN ACAD SCI SE, VVolume 64, P261

[3] A new formula for the breadth of Debye Scherrer lines [J]. PHYSICA, 1942, 9 : 833 - 852

[4] Bragg W.H., 1933, CRYSTALLINE STATE, V1

[5] The measurement of particle size by the X-ray method [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1938, 166 (A924) : 0016 - 0043

[6] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd ed.

[7] RAPID METHOD FOR ANALYZING BREADTHS OF DIFFRACTION AND SPECTRAL-LINES USING VOIGT FUNCTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) : 10 - 14

[8] LAUE M, 1936, ANN PHYS, V26, P55

[9] LOUER PD, 1972, J APPL CRYSTALLOGR, V5, P353

[10] MAUGUIN C, 1943, B SOC FRANC MIN, V66, P409

[1] ABRAMOWITZ M, 1964, HDB MATHEMATICAL FUN

[2] Anantharaman T.R., 1966, P INDIAN ACAD SCI SE, VVolume 64, P261

[3] A new formula for the breadth of Debye Scherrer lines [J]. PHYSICA, 1942, 9 : 833 - 852

[4] Bragg W.H., 1933, CRYSTALLINE STATE, V1

[5] The measurement of particle size by the X-ray method [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1938, 166 (A924) : 0016 - 0043

[6] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd ed.

[7] RAPID METHOD FOR ANALYZING BREADTHS OF DIFFRACTION AND SPECTRAL-LINES USING VOIGT FUNCTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) : 10 - 14

[8] LAUE M, 1936, ANN PHYS, V26, P55

[9] LOUER PD, 1972, J APPL CRYSTALLOGR, V5, P353

[10] MAUGUIN C, 1943, B SOC FRANC MIN, V66, P409