CRITICAL-EVALUATION OF HIGH-ENERGY ELECTRON-IMPACT SPECTROSCOPY TO MEASURE COMPTON PROFILES

被引：33

作者：

BARLAS, AD ^{[1
]}

RUECKNER, WHE ^{[1
]}

WELLENSTEIN, HF ^{[1
]}

机构：

[1] BRANDEIS UNIV,DEPT PHYS,WALTHAM,MA 02154

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 1978年 / 11卷 / 19期

关键词：

D O I：

10.1088/0022-3700/11/19/014

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3381 / 3400

页数：20

共 37 条

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[6]

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