LOW-HIGH HOMOJUNCTION IN THE STATIONARY STATE

被引:20
作者
KUZNICKI, ZT
机构
[1] CNRS, URR 292, LAB PHASE, F-67037 STRASBOURG, FRANCE
[2] UNIV STRASBOURG 1, F-67070 STRASBOURG, FRANCE
[3] DEPT PHYS, F-67000 STRASBOURG, FRANCE
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.348863
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work develops an analytical description of the electrostatic (stationary state) properties of an abrupt low-high homojunction within the context of Maxwell-Boltzmann statistics (nondegenerate semiconductors). The considerations are based on an application of the electrostatic law of abrupt junctions and summarized by a generalized approximate solution of Poisson's equation as an analytical representation combined with adapted numerical procedures. Low-field calculations give a set of universal curves which may be used to find direct relationships between the different distributions at any point within the free carrier space charge. This approach, having a relatively simple behavior as well as very high accuracy, shows especially the macroscopic features of the accumulated space charge on the lightly doped side and is especially useful in junction modelization and numerical simulations.
引用
收藏
页码:6526 / 6541
页数:16
相关论文
共 84 条
[1]  
ADIROVICH EI, 1958, SOV PHYS-TECH PHYS, V3, P49
[2]  
ANDO T, 1982, REV MOD PHYS, V54, P2
[3]   CARRIER ACCUMULATION IN GERMANIUM [J].
ARTHUR, JB ;
GIBSON, AF ;
GUNN, JB .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (07) :697-704
[4]   CURRENT GAIN AT L-H JUNCTIONS IN GERMANIUM [J].
ARTHUR, JB ;
GIBSON, AF ;
GUNN, JB .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (07) :705-711
[5]   CARRIER EXTRACTION IN GERMANIUM [J].
ARTHUR, JB ;
BARDSLEY, W ;
BROWN, MACS ;
GIBSON, AF .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (01) :43-50
[6]  
BARANOV LI, 1968, RADIO ENG ELECTRON P, V13, P1245
[7]  
BEERENS J, 1986, THESIS U SHERBROOKE
[8]  
BURGESS PE, 1955, P PHYS SOC LOND B, V68, P973
[9]  
CHANDRA A, 1979, SOLID STATE ELECTRON, V23, P516
[10]  
CHO SC, 1972, IEEE T ELECTRON DEV, V19, P954