LIGHT REFLECTANCE COMPARED WITH OTHER NITROGEN STRESS MEASUREMENTS IN CORN LEAVES

被引:235
作者
BLACKMER, TM [1 ]
SCHEPERS, JS [1 ]
VARVEL, GE [1 ]
机构
[1] UNIV NEBRASKA,USDA ARS,LINCOLN,NE 68583
关键词
D O I
10.2134/agronj1994.00021962008600060002x
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
New tools that can rapidly quantify the N status of corn could be valuable in N fertilizer management practices. This study was conducted to compare light reflectance from corn leaves with other parameters used to detect N deficiencies. Light reflectance (400-700 mm) as measured from corn leaves in the laboratory with a Hunter tristimulus colorimeter was compared with Minolta SPAD 502 chlorophyll meter readings (light transmittance at 650 and 940 nm), leaf N concentrations, and specific leaf N (N cont ent per unit area). Measurements were made on individual ear leaves collected from an irrigated corn N response trial with four hybrids and five N treatments. Light reflectance near 550 nm was the best wavelength to separate N treatment differences. Reflectance at 550 nm provided a stronger relationship with both leaf N concentration and chlorophyll meter readings than between chlorophyll ll meter readings and leaf N concentration. The measurement of light reflectance near 550 mn has promise as a technique to detect N deficiencies in corn leaves.
引用
收藏
页码:934 / 938
页数:5
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