PHYSICAL MODEL FOR ACOUSTIC SIGNATURES

被引：87

作者：

ATALAR, A

机构：

[1] Edward L.Ginzton Laboratory, Stanford University, Stanford

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 12期

关键词：

D O I：

10.1063/1.325924

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A physical model is presented to explain the interference phenomenon that gives rise to the material-dependent signature obtained from an acoustic reflection microscope. An approximate formula is derived for the peak separation of the characteristic response, and it agrees well with the experimental results.

引用

页码：8237 / 8239

页数：3

共 7 条

[1] PHASE IMAGING IN REFLECTION WITH ACOUSTIC MICROSCOPE [J].