STUDY OF ORGANIC FILMS BY USING TOTAL-REFLECTION OF X-RAYS

被引：2

作者：

EMELYANOV, Y

KHATKO, V

LUNEVICH, A

GLOBA, I

机构：

[1] Physical Technical Institute, Academy of Science of Belarus

来源：

SYNTHETIC METALS | 1993年 / 61卷 / 1-2期

关键词：

D O I：

10.1016/0379-6779(93)91224-P

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Amphiphilic polyamic acid films comprising 24, 50 and 74 monolayers were applied to silicon substrates by employing the Langmuir-Blodgett method. Their transformation into polyimide films was conducted by means of the stepwise heat treatment in a nitrogen atmosphere in the temperature range of approximately 300 to 600 K with a 25 K step width. In each annealing step the multilayer thickness and density were determined by using the method of X-ray reflectometry. It was shown that the decrease of the Langmuir-Blodgett film thickness in the course of heat treatment was associated with two processes: thermal imidation and removal of separated radicals from the volume.

引用

页码：195 / 198

页数：4