A STUDY OF ALPHA-PARTICLE TRACK PROFILES BY MEANS OF CONFOCAL MICROSCOPY

被引：6

作者：

GAIS, P ^{[1
]}

JAKES, J ^{[1
]}

SCHRAUBE, H ^{[1
]}

机构：

[1] GSF NEUHERBERG,INST STRAHLENSCHUTZ,D-85758 OBERSCHLEISSHEIM,GERMANY

来源：

RADIATION MEASUREMENTS | 1995年 / 25卷 / 1-4期

关键词：

LASER SCANNING MICROSCOPY; RADON; CR-39; TRACK PROFILE; ELECTROCHEMICAL ETCHING;

D O I：

10.1016/1350-4487(95)00246-B

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

The radial structures of etched tracks induced by randomly incidenting alpha-particles from radon and its progeny in the bare and 50 mu m polyethylene covered samples, made of the CR-39 plastics, were studied by means of the confocal imaging technique. The electrochemically etched tracks were sequentially sectioned into (1-2) mu m optical sections and reconstructed in three-dimensional images. The morphometric parameters of their radial cross-sections were measured.

引用

页码：767 / 768

页数：2