GAMMA-RAY SOURCES FOR COMPTON PROFILE MEASUREMENTS

被引：3

作者：

DUBARD, JL

机构：

[1] Dept. of Phys., Univ. of Louisville, Louisville, KY

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1979年 / 12卷 / 04期

关键词：

D O I：

10.1088/0022-3735/12/4/019

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The relative advantages of different gamma ray sources for Compton profile measurements are described and demonstrated in graphical form as a basis for instrumental system design.

引用

页码：302 / 307

页数：6

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