PHOTOCONDUCTION AND THERMOOPTIC HYSTERESIS MEASUREMENTS IN THIN CDS FILMS

被引：23

作者：

BOUCHENAKI, C ^{[1
]}

ULLRICH, B ^{[1
]}

ZIELINGER, JP ^{[1
]}

CONG, HN ^{[1
]}

CHARTIER, P ^{[1
]}

机构：

[1] UNIV STRASBOURG 1,DEPT CHIM,ELECTROCHIM & CHIM PHYS CORPS SOLIDE LAB,CNRS,URA 405,F-67008 STRASBOURG,FRANCE

来源：

JOURNAL OF CRYSTAL GROWTH | 1990年 / 101卷 / 1-4期

关键词：

D O I：

10.1016/0022-0248(90)91083-3

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

In this paper we present an investigation of thin CdS films (2-10 μm) prepared by three different techniques: evaporation, spray deposition method and CSVT (closed space vapor transport). For the characterization of our layers, we performed X-ray diffraction, optical transmission and photocurrent measurements. From these, we got information about the crystal structure, the absorption edge, the photoconductivity gain, the free carrier lifetime and the surface recombination time. Furthermore, we present the first results of a room temperature SF-SEED (sprayed film self-electro-optic effect device) showing the thermo-optical bistability in transmission and in photoconduction. © 1989.

引用

页码：797 / 801

页数：5

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