MEASUREMENT OF RELAXATION-TIME OF DIPOLE BY THERMALLY STIMULATED CURRENT

[1] BUCCI C, 1966, PHYS REV, V148, P148

[2] GROSSWEINER LJ, 1954, J APPL PHYS, V24, P1306

[3] AN APPROXIMATE METHOD FOR DEDUCING DIELECTRIC LOSS FACTOR FROM DIRECT CURRENT MEASUREMENTS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1952, 99 (03): : 151 - 155

[4] ELECTRICAL CONDUCTION IN EVAPORATED SILICON OXIDE FILMS [J]. THIN SOLID FILMS, 1969, 3 (05) : 341 - &

[1] BUCCI C, 1966, PHYS REV, V148, P148

[2] GROSSWEINER LJ, 1954, J APPL PHYS, V24, P1306

[3] AN APPROXIMATE METHOD FOR DEDUCING DIELECTRIC LOSS FACTOR FROM DIRECT CURRENT MEASUREMENTS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1952, 99 (03): : 151 - 155

[4] ELECTRICAL CONDUCTION IN EVAPORATED SILICON OXIDE FILMS [J]. THIN SOLID FILMS, 1969, 3 (05) : 341 - &