SECONDARY-EMISSION PROPERTIES AS A FUNCTION OF THE ELECTRON INCIDENCE ANGLE

被引：63

作者：

SHIH, A

HOR, C

机构：

[1] Naval Research Laboratory, Washington

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1993年 / 40卷 / 04期

关键词：

Auger electron spectroscopy - Computer software - Electron emission - Molybdenum;

D O I：

10.1109/16.202797

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Computer codes are presently being developed for the purpose of improving the understanding of Crossed-Field Amplifier (CFA) performance. These codes require a more complete and reliable database of the secondary electron emission properties of the electrode materials than exists in the literature. We describe an experimental method and present results of the secondary emission yield measurements on molybdenum surfaces, both clean and gas-exposed. The surface cleanliness was monitored by Auger Electron Spectroscopy (AES), and all measurements made under ultra-high vacuum conditions (better than 1 x 10(-10) torr). Our results differ from the existing data for which the surface cleanliness was not determined. The secondary electron emission yields were measured as a function of the primary electron energy and also of the angle of incidence. The results were fitted with the analytical expressions of Vaughan, and the comparison found good overall agreement if Vaughan's formulas are slightly modified from the originally proposed form.

引用

页码：824 / 829

页数：6

共 14 条

[1] THE SECONDARY-ELECTRON EMISSION COEFFICIENT OF DISORDERED SURFACES [J].