A KINETIC-MODEL OF TIME-DEPENDENT DIELECTRIC-BREAKDOWN FOR POLYMERS

被引：25

作者：

DING, HZ ^{[1
]}

XING, XS ^{[1
]}

ZHU, HS ^{[1
]}

机构：

[1] ACAD SINICA, INT CTR MAT PHYS, SHENYANG 110015, PEOPLES R CHINA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1994年 / 27卷 / 03期

关键词：

D O I：

10.1088/0022-3727/27/3/026

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A kinetic model of time-dependent dielectric breakdown for polymers is presented. The micromechanism of thermally activated bond-breakdown is developed for polymers to account for the dynamical process of dielectric breakdown. We first prove that the thermally activated polymer bond-breakdown processes can explain not only the burst of a conducting pathway nucleated in any defect and the following successive propagation, but also the time-dependent dielectric breakdown strength of polymers. The formulae for conducting microcrack growth rate and time to failure are derived and applied to the experimental data for polyethylene terephthalate films.

引用

页码：591 / 595

页数：5

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